CHARACTERIZATION OF SILICON BY ION-BEAM TECHNIQUES - CONCLUSION

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作者：
SIFFERT, P
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来源：
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1984年 / 8卷 / 1-2期
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暂无
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O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
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页码：181 / 184
页数：4
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