ION-BEAM DOPING OF MBE SILICON BY AS+

被引:7
|
作者
HOUGHTON, DC [1 ]
DENHOFF, MW [1 ]
JACKMAN, TE [1 ]
SWANSON, ML [1 ]
PARIKH, N [1 ]
机构
[1] UNIV N CAROLINA, DEPT PHYS & ASTRON, CHAPEL HILL, NC 27514 USA
关键词
D O I
10.1149/1.2095512
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:3109 / 3113
页数:5
相关论文
共 50 条
  • [1] ION-BEAM DOPING OF MBE SILICON BY ARSENIC
    HOUGHTON, DC
    DENHOFF, MW
    JACKMAN, TE
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (8B) : C547 - C547
  • [2] ION-BEAM ANNEALED AS+ IMPLANTED SILICON
    HEMMENT, PLF
    MAYDELLONDRUSZ, E
    SCOVELL, PD
    [J]. ELECTRONICS LETTERS, 1982, 18 (02) : 57 - 59
  • [3] MEV ION-BEAM INDUCED CRYSTALLIZATION IN HIGH-ENERGY AS+ ION-IMPLANTED SILICON
    WANG, ZL
    ZHANG, BX
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 : 439 - 443
  • [4] Specific features of doping with antimony during the ion-beam crystallization of silicon
    A. S. Pashchenko
    S. N. Chebotarev
    L. S. Lunin
    V. A. Irkha
    [J]. Semiconductors, 2016, 50 : 545 - 548
  • [5] ORIENTATION AND DOPING EFFECTS IN ION-BEAM ANNEALING OF ALPHA-SILICON
    LAFERLA, A
    CANNAVO, S
    FERLA, G
    CAMPISANO, SU
    RIMINI, E
    SERVIDORI, M
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 19-20 : 470 - 474
  • [6] Specific features of doping with antimony during the ion-beam crystallization of silicon
    Pashchenko, A. S.
    Chebotarev, S. N.
    Lunin, L. S.
    Irkha, V. A.
    [J]. SEMICONDUCTORS, 2016, 50 (04) : 545 - 548
  • [7] ION-BEAM ANNEALING OF SILICON
    HODGSON, RT
    BAGLIN, JEE
    PAL, R
    NERI, JM
    HAMMER, DA
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : C110 - C110
  • [8] ION-BEAM APPARATUS FOR SEMICONDUCTOR DOPING
    ILYUSHKIN, VA
    KOTLYAREVSKII, MB
    LUDZISH, OS
    NOSKOV, DA
    SHIBAEV, YA
    SHVETSOV, YV
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1978, 21 (05) : 1447 - 1447
  • [9] OXIDATION OF METALS BY AN OXYGEN ION-BEAM IN THE MBE PROCESS
    SHIMIZU, T
    NONAKA, H
    ARAI, K
    [J]. SURFACE AND INTERFACE ANALYSIS, 1992, 19 (1-12) : 365 - 368
  • [10] HIGH-RESOLUTION ELECTRON-MICROSCOPY ANALYSIS OF ION-BEAM INDUCED ANNEALING OF MEV AS+ ION-IMPLANTED SILICON
    ZHANG, BX
    WANG, ZL
    QI, L
    ZHANG, PJ
    ZHENG, JG
    WANG, LC
    DU, AY
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 : 434 - 438