FOCUSED BORON ION-BEAM IMPLANTATION INTO SILICON

被引:7
|
作者
TAMURA, M
SHUKURI, S
ICHIKAWA, M
WADA, Y
ISHITANI, T
机构
关键词
D O I
10.1016/0168-583X(85)90483-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:858 / 863
页数:6
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