Ion-Beam Etching Techniques in Uranium Metallography

被引：0
|
作者：
Frafjord, J. J.
Bridges, R. L.
Dekanich, S. J.
机构：
[1] Y-12 National Security Complex, Oak Ridge, TN 37831, Bear Creek Rd.
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609099279
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：790 / 791
页数：2
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