DESIGN OF DIAGNOSTIC TESTS FOR SYNCHRONOUS SEQUENTIAL CIRCUITS

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作者：

TYURIN, AV

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来源：

AUTOMATION AND REMOTE CONTROL | 1974年 / 35卷 / 07期

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中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

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页码：1132 / 1140

页数：9

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