DESIGN OF DIAGNOSTIC TESTS FOR SYNCHRONOUS SEQUENTIAL CIRCUITS

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作者：
TYURIN, AV
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来源：
AUTOMATION AND REMOTE CONTROL | 1974年 / 35卷 / 07期
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TP [自动化技术、计算机技术];
学科分类号：
0812 ;
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页码：1132 / 1140
页数：9
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