Minimal march test algorithm for detection of linked static faults in random access memories

被引：12

作者：

Harutunyan, G. ^{[1
]}

Vardanian, V. A. ^{[1
]}

Zorian, Y. ^{[2
]}

机构：

[1] Virage Log, 15-1 Khorenatsi Str, Yerevan 375010, Armenia

[2] Virage Log, Fremont, CA 94538 USA

来源：

24TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2006年

关键词：

D O I：

10.1109/VTS.2006.46

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, a new notion of 2-composite static faults covering all unlinked and (realistic) linked static faults is introduced. We have introduced 120 new linked fault primitives missing in the paper by Hamdioui et al (IEEE TCAD 2004), thus extending the universe of linked fault primitives known before by 25%. A March test algorithm of length 23N (N - number of memory words) for detection of linked static faults in Random Access Memories is proposed. It reduces the length of a previously known algorithm (Hamdioui et al, IEEE TCAD 2004) by 18N. We proved the proposed test is of minimum length.

引用

页码：120 / +

页数：2

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