ALGORITHM FOR TESTING RANDOM-ACCESS MEMORIES

被引：0

|

作者：

KNAIZUK, J ^{[1
]}

HARTMANN, CRP ^{[1
]}

机构：

[1] SYRACUSE UNIV,DEPT SYST & INFORMAT SCI,SYRACUSE,NY 13210

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1977年 / 26卷 / 04期

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D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

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页码：414 / 416

页数：3

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