FUNCTIONAL TESTING OF SEMICONDUCTOR RANDOM-ACCESS MEMORIES

被引：1

|

作者：

ABADIR, MS

REGHBATI, HK

机构：

[1] UNIV SASKATCHEWAN,SASKATOON S7N 0W0,SASKATCHEWAN,CANADA

[2] SIMON FRASER UNIV,DEPT COMP SCI,BURNABY V5A 1S6,BC,CANADA

来源：

COMPUTING SURVEYS | 1983年 / 15卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

引用

收藏

页码：175 / 198

页数：24

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