ALGORITHM FOR TESTING RANDOM-ACCESS MEMORIES

被引：0
|
作者：
KNAIZUK, J [1 ]
HARTMANN, CRP [1 ]
机构：
[1] SYRACUSE UNIV,DEPT SYST & INFORMAT SCI,SYRACUSE,NY 13210
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1977年 / 26卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：414 / 416
页数：3
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