An extended march test algorithm for embedded memories

被引：1
|
作者：
Park, GM
Chang, H
机构：
来源：
SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS | 1997年
关键词：
D O I：
10.1109/ATS.1997.643990
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
In this paper, an efficient test algorithm and BIST architecture for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault. Moreover, the proposed test algorithm can detect neighborhood pattern sensitive fault, which could not be detected in previous march test algorithms. The proposed test algorithm performs testing for neighborhood pattern sensitive fault using background data, which has been used for word-oriented memory testing.
引用
收藏
页码：404 / 409
页数：6
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