TEST PROCEDURES FOR A CLASS OF PATTERN-SENSITIVE FAULTS IN SEMICONDUCTOR RANDOM-ACCESS MEMORIES

被引：0

作者：

SUK, DS ^{[1
]}

REDDY, SM ^{[1
]}

机构：

[1] UNIV IOWA,DEPT ELECT & COMP ENGN,IOWA CITY,IA 52242

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1980年 / 29卷 / 06期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：419 / 429

页数：11

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