A Multibackground March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories

被引：4

作者：

Huzum, C. ^{[1
]}

Cascaval, P. ^{[1
]}

机构：

[1] Gheorghe Asachi Tech Univ Iasi, Dept Comp Sci & Engn, Iasi, Romania

来源：

ELEKTRONIKA IR ELEKTROTECHNIKA | 2012年 / 119卷 / 03期

关键词：

D O I：

10.5755/j01.eee.119.3.1369

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

C. Huzum, P. Cascaval. A Multibackground March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories // Electronics and Electrical Engineering. - Kaunas: Technologija, 2012. - No. 3(119). - P. 81-86. A multibackground March test (March-76N) for a model of static neighborhood pattern sensitive faults (NPSFs) in N x 1 random-access memories is presented. March-76N is able to cover both simple and linked NPSFs. As any other test dedicated to the NPSFs, March-76N assumes that the storage cells are arranged in a rectangular grid and the mapping from logical addresses to physical cell locations is known completely. With a length of 76N, this March test is more efficient than other published tests dedicated to this model. Ill. 4, bibl. 16, tabl. 4 (in English; abstracts in English and Lithuanian).

引用

页码：81 / 86

页数：6

共 50 条

[1] DETECTION OF PATTERN-SENSITIVE FAULTS IN RANDOM-ACCESS MEMORIES
HAYES, JP
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (02) : 150 - 157
[2] TEST PROCEDURES FOR A CLASS OF PATTERN-SENSITIVE FAULTS IN SEMICONDUCTOR RANDOM-ACCESS MEMORIES
SUK, DS
REDDY, SM
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1980, 29 (06) : 419 - 429
[3] A GRAPH MODEL FOR PATTERN-SENSITIVE FAULTS IN RANDOM-ACCESS MEMORIES
SETH, SC
NARAYANASWAMY, K
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1981, 30 (12) : 973 - 977
[4] PARALLEL TESTING FOR PATTERN-SENSITIVE FAULTS IN SEMICONDUCTOR RANDOM-ACCESS MEMORIES
MAZUMDER, P
PATEL, JK
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1989, 38 (03) : 394 - 407
[5] Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories
Cheng, KL
Tsai, MF
Wu, CW
[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2002, 21 (11) : 1328 - 1336
[6] A MARCH TEST FOR FUNCTIONAL FAULTS IN SEMICONDUCTOR RANDOM-ACCESS MEMORIES
SUK, DS
REDDY, SM
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1981, 30 (12) : 982 - 985
[7] March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories
Cascaval, P.
Cascaval, D.
[J]. MICROELECTRONICS JOURNAL, 2019, 93
[8] Testing active neighborhood pattern-sensitive faults of ternary content addressable memories
Huang, Yu-Jen
Li, Jin-Fu
[J]. ETS 2006: ELEVENTH IEEE EUROPEAN TEST SYMPOSIUM, PROCEEDINGS, 2006, : 55 - +
[9] Efficient neighborhood pattern-sensitive fault test algorithms for semiconductor memories
Cheng, KL
Tsai, MF
Wu, CW
[J]. 19TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2001, : 225 - 230
[10] Minimal march test algorithm for detection of linked static faults in random access memories
Harutunyan, G.
Vardanian, V. A.
Zorian, Y.
[J]. 24TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2006, : 120 - +

← 1 2 3 4 5 →