March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories

被引：5
|
作者：
Cascaval, P. [1 ]
Cascaval, D. [2 ]
机构：
[1] Gheorghe Asachi Tech Univ Iasi, Dept Comp Sci & Engn, Bd D Mangeron 27, Iasi 700050, Romania
[2] Gheorghe Asachi Tech Univ Iasi, Dept Ind Engn, Bd D Mangeron 27, Iasi 700050, Romania
来源：
MICROELECTRONICS JOURNAL | 2019年 / 93卷
关键词：
D O I：
10.1016/j.mejo.2019.104619
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A memory fault model regarding the unlinked static three-cell coupling faults in n x 1 random-access memories is discussed. This model is an extension of the well- known model of unlinked static two-cell coupling faults. Because this model of three-cell coupling is limited to the physically neighbouring memory cells, it can also be considered a neighbourhood pattern-sensitive model. An efficient march test algorithm able to cover this reduced model of three-cell coupling is presented in this letter.
引用
收藏
页数：4
相关论文
共 21 条
  • [1] March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories
    Cascaval, Petru
    Cascaval, Doina
    [J]. MICROELECTRONICS JOURNAL, 2010, 41 (04) : 212 - 218
  • [2] A New Test Algorithm and Fault Simulator of Simplified Three-Cell Coupling Faults for Random Access Memories
    Wu, Tiancheng
    Fan, Weikang
    Gu, Yuefeng
    Fan, Feifan
    Li, Qiuhong
    [J]. IEEE ACCESS, 2024, 12 : 109218 - 109229
  • [3] Minimal march tests for unlinked static faults in Random Access Memories
    Harutunyan, G
    Vardanian, VA
    Zorian, Y
    [J]. 23RD IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2005, : 53 - 59
  • [4] A MARCH TEST FOR FUNCTIONAL FAULTS IN SEMICONDUCTOR RANDOM-ACCESS MEMORIES
    SUK, DS
    REDDY, SM
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 1981, 30 (12) : 982 - 985
  • [5] A Multibackground March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories
    Huzum, C.
    Cascaval, P.
    [J]. ELEKTRONIKA IR ELEKTROTECHNIKA, 2012, 119 (03) : 81 - 86
  • [6] Efficient march tests for a reduced 3-coupling and 4-coupling faults in random-access memories
    Cascaval, P
    Bennett, S
    Hutanu, C
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2004, 20 (03): : 227 - 243
  • [7] Minimal march test algorithm for detection of linked static faults in random access memories
    Harutunyan, G.
    Vardanian, V. A.
    Zorian, Y.
    [J]. 24TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2006, : 120 - +
  • [8] Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories
    Petru Caşcaval
    Stuart Bennett
    Corneliu Huţanu
    [J]. Journal of Electronic Testing, 2004, 20 : 227 - 243
  • [9] Efficient march test for 3-coupling faults in random access memories
    Cascaval, P
    Bennett, S
    [J]. MICROPROCESSORS AND MICROSYSTEMS, 2001, 24 (10) : 501 - 509
  • [10] Low Power March Memory Test Algorithm for Static Random Access Memories
    Kumar, G. Rajesh
    Babulu, K.
    [J]. INTERNATIONAL JOURNAL OF ENGINEERING, 2018, 31 (02): : 292 - 298
123