Minimal march tests for unlinked static faults in Random Access Memories

被引：30
|
作者：
Harutunyan, G [1 ]
Vardanian, VA [1 ]
Zorian, Y [1 ]
机构：
[1] Virage Log, Yerevan 375010, Armenia
来源：
23RD IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2005年
关键词：
D O I：
10.1109/VTS.2005.56
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
New minimal March test algorithms are proposed for detection of (all) unlinked static faults in Random Access Memories. In particular, a new minimal March MSS test of complexity 18N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).
引用
收藏
页码：53 / 59
页数：7
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