Minimal march tests for unlinked static faults in Random Access Memories

被引：30

作者：

Harutunyan, G ^{[1
]}

Vardanian, VA ^{[1
]}

Zorian, Y ^{[1
]}

机构：

[1] Virage Log, Yerevan 375010, Armenia

来源：

23RD IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2005年

关键词：

D O I：

10.1109/VTS.2005.56

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

New minimal March test algorithms are proposed for detection of (all) unlinked static faults in Random Access Memories. In particular, a new minimal March MSS test of complexity 18N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).

引用

页码：53 / 59

页数：7

共 50 条

[21] Generating complete and optimal march tests for linked faults in memories
Al-Harbi, SM
Gupta, SK
[J]. 21ST IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2003, : 254 - 261
[22] March U: A test for unlinked memory faults
vandeGoor, AJ
Gaydadjiev, GN
[J]. IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, 1997, 144 (03): : 155 - 160
[23] Automatic march tests generation for static and dynamic faults in SRAMs
Benso, A
Bosio, A
Di Carlo, S
Di Natale, G
Prinetto, P
[J]. ETS 2005:10TH IEEE EUROPEAN TEST SYMPOSIUM, PROCEEDINGS, 2005, : 122 - 127
[24] Automatic march tests generations for Static Linked Faults in SRAMs
Benso, A.
Bosio, A.
Di Carlo, S.
Di Natale, G.
Prinetto, P.
[J]. 2006 DESIGN AUTOMATION AND TEST IN EUROPE, VOLS 1-3, PROCEEDINGS, 2006, : 1258 - +
[25] March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories
Cascaval, Petru
Cascaval, Doina
[J]. MICROELECTRONICS JOURNAL, 2010, 41 (04) : 212 - 218
[26] SOURCE LIST - STATIC RANDOM-ACCESS MEMORIES
不详
[J]. ELECTRONIC PRODUCTS MAGAZINE, 1988, 30 (16): : 40 - 41
[27] Si/SiGe Tunnelling Static Random Access Memories
Ternent, G.
Paul, D. J.
[J]. SIGE, GE, AND RELATED COMPOUNDS 5: MATERIALS, PROCESSING, AND DEVICES, 2012, 50 (09): : 987 - 990
[28] Random testing of multi-port static random access memories
Karimi, F
Meyer, FJ
Lombardi, F
[J]. PROCEEDING OF THE 2002 IEEE INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN AND TESTING, 2002, : 101 - 106
[29] DETECTION OF PATTERN-SENSITIVE FAULTS IN RANDOM-ACCESS MEMORIES
HAYES, JP
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (02) : 150 - 157
[30] SEU ground and flight data in static random access memories
Liu, J
Duan, JL
Hou, MD
Sun, YM
Yao, HJ
Mo, D
Zhang, QX
Wang, ZG
Jin, YF
Cai, JR
Ye, ZH
Han, JW
Lin, YL
Huang, Z
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 245 (01): : 342 - 345

← 1 2 3 4 5 →