A New Test Algorithm and Fault Simulator of Simplified Three-Cell Coupling Faults for Random Access Memories

被引：0

作者：

Wu, Tiancheng ^{[1
,2
]}

Fan, Weikang ^{[1
]}

Gu, Yuefeng ^{[1
]}

Fan, Feifan ^{[2
]}

Li, Qiuhong ^{[1
,2
]}

机构：

[1] Xiamen Univ, Sch Elect Sci & Engn, Xiamen 361005, Peoples R China

[2] Xiamen Univ, Pen Tung Sah Inst Micronano Sci & Technol, Xiamen 361005, Peoples R China

来源：

IEEE ACCESS | 2024年 / 12卷

关键词：

Couplings; Random access memory; Complexity theory; Memory management; Software algorithms; Testing; Task analysis; Design for testability; fault simulator; march algorithm; memory testing; three-cell coupling fault; FUNCTIONAL FAULTS; MARCH TESTS;

D O I：

10.1109/ACCESS.2024.3439626

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This study introduces a novel algorithm for the detection of three-cell coupling faults, March ML3C, along with a simulator, TCFS. The March ML3C algorithm targets the detection of single-port, static, and unlinked three-cell coupling faults within bit-oriented random access memory (RAM). March ML3C improves the coverage of three-cell coupling faults to 100%, with a complexity of only 58n (n is the number of memory cells), which is lower than that of most similar algorithms. Furthermore, to solve the problem of none of the existing tools supporting the simulation of three-cell coupling faults, this study designs and implements TCFS, which can quickly simulate all March-type algorithms and calculate the coverages for three-cell coupling faults, thus achieving the purpose of software simulation of the algorithms. The simulation results of March ML3C and other similar algorithms using TCFS are also presented in this paper.

引用

页码：109218 / 109229

页数：12

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