A Multibackground March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories

被引：4

作者：

Huzum, C. ^{[1
]}

Cascaval, P. ^{[1
]}

机构：

[1] Gheorghe Asachi Tech Univ Iasi, Dept Comp Sci & Engn, Iasi, Romania

来源：

ELEKTRONIKA IR ELEKTROTECHNIKA | 2012年 / 119卷 / 03期

关键词：

D O I：

10.5755/j01.eee.119.3.1369

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

C. Huzum, P. Cascaval. A Multibackground March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories // Electronics and Electrical Engineering. - Kaunas: Technologija, 2012. - No. 3(119). - P. 81-86. A multibackground March test (March-76N) for a model of static neighborhood pattern sensitive faults (NPSFs) in N x 1 random-access memories is presented. March-76N is able to cover both simple and linked NPSFs. As any other test dedicated to the NPSFs, March-76N assumes that the storage cells are arranged in a rectangular grid and the mapping from logical addresses to physical cell locations is known completely. With a length of 76N, this March test is more efficient than other published tests dedicated to this model. Ill. 4, bibl. 16, tabl. 4 (in English; abstracts in English and Lithuanian).

引用

页码：81 / 86

页数：6

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