Guest Editors' Introduction: Speeding Up Analog Integration and Test for Mixed-Signal SoCs

被引：0
|
作者：
Parekhji, Rubin [1 ]
Butler, Kenneth M. [1 ]
Roberts, Gordon W. [2 ]
机构：
[1] Texas Instruments Inc, Bangalore, Karnataka, India
[2] McGill Univ, Montreal, PQ H3A 2T5, Canada
来源：
IEEE DESIGN & TEST | 2015年 / 32卷 / 01期
关键词：
D O I：
10.1109/MDAT.2014.2370851
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：6 / 8
页数：3
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