Guest Editors' Introduction: Speeding Up Analog Integration and Test for Mixed-Signal SoCs

被引：0

作者：

Parekhji, Rubin ^{[1
]}

Butler, Kenneth M. ^{[1
]}

Roberts, Gordon W. ^{[2
]}

机构：

[1] Texas Instruments Inc, Bangalore, Karnataka, India

[2] McGill Univ, Montreal, PQ H3A 2T5, Canada

来源：

IEEE DESIGN & TEST | 2015年 / 32卷 / 01期

关键词：

D O I：

10.1109/MDAT.2014.2370851

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：6 / 8

页数：3

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