Oscillation-test strategy for analog and mixed-signal integrated circuits

被引：93
|
作者：
Arabi, K [1 ]
Kaminska, B [1 ]
机构：
[1] ECOLE POLYTECH,DEPT ELECT & COMP ENGN,MONTREAL,PQ H3C 3A7,CANADA
来源：
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/VTEST.1996.510896
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：476 / 482
页数：7
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