Integrated Design and Test of Mixed-Signal Circuits

被引：0
|
作者：
Nur Engin
Hans G. Kerkhoff
Ronald J.W.T. Tangelder
Han Speek
机构：
[1] University of Twente,MESA Research Institute
来源：
Journal of Electronic Testing | 1999年 / 14卷
关键词：
design and test integration; mixed-signal test; specification-based testing; test plan generation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
In this paper, the integration of design and test flows for mixed-signal circuits is discussed. The aim is to decrease test generation and debugging costs and time-to-market for the analogue blocks in mixed-signal circuits. A tool developed in order to automate the data sharing between design and test environments is described and the functionality of this tool is explained. The generation of a test plan consists of the selection of the separate test functions and addition of commands for control signal generation and tester routing. The usage of design data for each of these functions is explained and the tool is evaluated in the design and testing of a mixed-signal demonstrator circuit. Results from this experience are discussed.
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页码：75 / 83
页数：8
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