DESIGN-FOR-TESTABILITY AUTOMATION OF MIXED-SIGNAL INTEGRATED CIRCUITS

被引：0
|
作者：
Mosin, Sergey [1 ]
机构：
[1] VSU, Dept Comp Engn, Vladimir, Russia
来源：
2013 IEEE 26TH INTERNATIONAL SOC CONFERENCE (SOCC) | 2013年
关键词：
ANALOG;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The methodology to computer-aided design-for- testability (DFT) of mixed-signal IC is proposed. Functional model of DFT-automation is presented as IDEF0-diagram based on the system analysis. The purpose and principal realization of the key DFT processes in the model are considered. The decision criterions of effective DFT-solution for particular mixed-signal circuit design are proposed. The features of testing circuitries library are descried. Experimental results of the methodology application for analog-digital ADPCM codec are presented.
引用
收藏
页码：244 / 249
页数：6
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