A test paradigm for analog and mixed-signal circuits and systems

被引：0
|
作者：
Wang, CP [1 ]
Hatzopoulos, AA [1 ]
Wey, CL [1 ]
机构：
[1] MICHIGAN STATE UNIV,DEPT ELECT ENGN,E LANSING,MI 48824
来源：
ISCAS 96: 1996 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS - CIRCUITS AND SYSTEMS CONNECTING THE WORLD, VOL 3 | 1996年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：194 / 197
页数：4
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