Benchmark circuits for analog and mixed-signal testing

被引：46

作者：

Kondagunturi, R ^{[1
]}

Bradley, E ^{[1
]}

Maggard, K ^{[1
]}

Stroud, C ^{[1
]}

机构：

[1] Univ Kentucky, Dept Elect Engn, Lexington, KY 40506 USA

来源：

IEEE SOUTHEASTCON '99, PROCEEDINGS | 1999年

关键词：

D O I：

10.1109/SECON.1999.766127

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

This paper proposes a standard set of fault models and establishes acceptable component variations for a new set of benchmark circuits used to evaluate analog and mixed-signal testing techniques.(1)

引用

页码：217 / 220

页数：4

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