Guest Editors' Introduction: Speeding Up Analog Integration and Test for Mixed-Signal SoCs

被引：0
|
作者：
Parekhji, Rubin [1 ]
Butler, Kenneth M. [1 ]
Roberts, Gordon W. [2 ]
机构：
[1] Texas Instruments Inc, Bangalore, Karnataka, India
[2] McGill Univ, Montreal, PQ H3A 2T5, Canada
来源：
IEEE DESIGN & TEST | 2015年 / 32卷 / 01期
关键词：
D O I：
10.1109/MDAT.2014.2370851
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：6 / 8
页数：3
相关论文
共 50 条
  • [21] Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing
    Huang, Ke
    Barragan, Manuel J.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2018, 34 (03): : 213 - 214
  • [22] Magma takes on mixed-signal SOCs
    Wilson, Ron
    EDN, 2008, 53 (06) : 22 - 22
  • [23] Fast Validation of Mixed-Signal SoCs
    Stanley, Daniel
    Wang, Can
    Kim, Sung-Jin
    Herbst, Steven
    Kim, Jaeha
    Horowitz, Mark
    IEEE Open Journal of the Solid-State Circuits Society, 2021, 1 : 184 - 195
  • [24] Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing
    Ke Huang
    Manuel J. Barragan
    Journal of Electronic Testing, 2018, 34 : 213 - 214
  • [25] Tutorial introduction to research on analog and mixed-signal circuit testing
    Milor, Linda S.
    IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 1998, 45 (10): : 1389 - 1407
  • [26] Guest Editors' Introduction: Competing to Secure SoCs
    Garg, Siddharth
    Holcomb, Daniel
    Rajendran, Jeyavijayan
    Sadeghi, Ahmad-Reza
    IEEE DESIGN & TEST, 2021, 38 (01) : 5 - 6
  • [27] JOINT SPECIAL ISSUE ON ANALOG AND MIXED-SIGNAL TESTING - INTRODUCTION
    SOMA, M
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 1993, 4 (03) : 197 - 198
  • [28] A tutorial introduction to research on analog and mixed-signal circuit testing
    Milor, LS
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 1998, 45 (10) : 1389 - 1407
  • [29] SPECIAL ISSUE - ANALOG SIGNAL-PROCESSING - GUEST EDITORS INTRODUCTION
    ARONHIME, PB
    STEPHENSON, FW
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 1994, 6 (03) : 177 - 178
  • [30] PUTTING TOGETHER A TEST STRATEGY FOR ANALOG AND MIXED-SIGNAL ASICS
    PATE, RM
    ROGERS, JS
    COMPUTER DESIGN, 1994, 33 (02): : A29 - A34
12345