PUTTING TOGETHER A TEST STRATEGY FOR ANALOG AND MIXED-SIGNAL ASICS

被引：0

作者：

PATE, RM ^{[1
]}

ROGERS, JS ^{[1
]}

机构：

[1] HARRIS SEMICOND CORP,PROD ENGN & TEST DEV,PALM BAY,FL

来源：

COMPUTER DESIGN | 1994年 / 33卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：A29 / A34

页数：6

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