共 50 条
- [31] Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology [J]. 2020 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2020,
- [32] SRAF Optimization for sub-40nm Technology Node Contact Patterning [J]. CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2012 (CSTIC 2012), 2012, 44 (01): : 283 - 290
- [33] Scaling Beyond 7nm: Design-Technology Co-optimization at the Rescue [J]. PROCEEDINGS OF THE 2016 INTERNATIONAL SYMPOSIUM ON PHYSICAL DESIGN (ISPD'16), 2016, : 89 - 89
- [34] Design technology co-optimization for a robust 10nm Metal1 solution for Logic design and SRAM [J]. DESIGN-PROCESS-TECHNOLOGY CO-OPTIMIZATION FOR MANUFACTURABILITY VIII, 2014, 9053
- [35] TCAD Device Technology Co-Optimization Workflow for Manufacturable MRAM Technology [J]. 2020 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2020,
- [36] Design Technology Co-Optimization and Time-Efficient Verification for Enhanced Pin Accessibility in the Post-3-nm Node [J]. IEEE ACCESS, 2024, 12 : 97557 - 97571
- [38] Design-Technology Co-Optimization of Anti-Fuse Memory on Intel 22nm FinFET Technology [J]. 2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2019,
- [39] Is Sub-10nm Thick 3D-Topological Insulator Good for the Local Electrical Interconnects? [J]. 2013 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2013,
- [40] Variability-aware TCAD Based Design-Technology Co-Optimization Platform for 7nm Node Nanowire and Beyond [J]. 2016 IEEE SYMPOSIUM ON VLSI TECHNOLOGY, 2016,