Scaling Beyond 7nm: Design-Technology Co-optimization at the Rescue

被引：2
|
作者：
Ryckaert, Julien [1 ]
机构：
[1] IMEC, Leuven, Belgium
来源：
PROCEEDINGS OF THE 2016 INTERNATIONAL SYMPOSIUM ON PHYSICAL DESIGN (ISPD'16) | 2016年
关键词：
Design-technology co-optimization; Technology scaling;
D O I：
10.1145/2872334.2893446
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
引用
收藏
页码：89 / 89
页数：1
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