REMOTE MEASUREMENT OF THIN FILM SHEET RESISTANCE

被引：0

|

作者：

MITCHINSON, JC

PRINGLE, RD

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1971年 / 4卷 / NDEC期

关键词：

D O I：

10.1088/0022-3735/4/12/045

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1078 / +

页数：1

相关论文

共 50 条

[21] Bank measurement in film and sheet extrusion
Gross, H
[J]. KUNSTSTOFFE-PLAST EUROPE, 1998, 88 (08): : 1229 - 1231
[22] Spatial resolution measurement of giant magneto-resistance thin film
Yoshizawa, N
Nakane, H
Negishi, T
Shimada, Y
Kikuchi, T
Arai, K
[J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2002, 239 (1-3) : 198 - 200
[23] Sheet resistance measurement of thin metallic films and stripes at both 130 GHz and DC
Lee, MHJ
Collier, RJ
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (06) : 2412 - 2415
[24] Design and Evaluation of a High-accuracy Measurement System for Sheet Resistance of Thin Films
Pan, Haibin
Ding, Jianning
Cao, Baoguo
Cheng, Guanggui
[J]. MICRO-NANO TECHNOLOGY XV, 2014, 609-610 : 106 - +
[25] RESISTANCE TO FRACTURE OF THIN SHEET MATERIALS
MARCHENKO, VG
SAVCHENKO, EA
PCHELINTSEV, VA
[J]. INDUSTRIAL LABORATORY, 1979, 45 (03): : 341 - 342
[26] Remote Complex Resistance Measurement
Aristov, V.
[J]. AUTOMATIC CONTROL AND COMPUTER SCIENCES, 2023, 57 (05) : 469 - 472
[27] REMOTE MULTICHANNEL RESISTANCE MEASUREMENT
VANDERVEER, W
[J]. ELECTRONICS WORLD & WIRELESS WORLD, 1995, (1714): : 794 - 794
[28] Remote multichannel resistance measurement
vanderVeer, W
[J]. ELECTRONICS WORLD, 1996, (1720): : 236 - 236
[29] Remote Complex Resistance Measurement
V. Aristov
[J]. Automatic Control and Computer Sciences, 2023, 57 : 469 - 472
[30] Sheet Resistance of the TiAlNiAu Thin-Film Metallization of Ohmic Contacts to Nitride Semiconductor Structures
N. A. Torkhov
[J]. Semiconductors, 2019, 53 : 28 - 36

← 1 2 3 4 5 →