共 50 条
- [41] Kinetics characterization of the oxidation of Cu thin films at low temperature by using sheet resistance measurement [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2008, 90 (02): : 263 - 266
- [42] Kinetics characterization of the oxidation of Cu thin films at low temperature by using sheet resistance measurement [J]. Applied Physics A, 2008, 90 : 263 - 266
- [44] NONDESTRUCTIVE MEASUREMENT OF HYDROGEN IN THIN SHEET MATERIALS [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 115 (01): : 271 - 275
- [45] Measurement of the semiconductor film resistance [J]. ISTM/97 - 2ND INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, CONFERENCE PROCEEDINGS, 1997, : 332 - 335
- [47] Transparent thin film nanotube assemblies with low sheet resistance via acid doping: An alternative to ITO [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2012, 244
- [48] The Fractal Geometry of TiAlNiAu Thin Film Metal System and Its Sheet Resistance (Lateral Size Effect) [J]. SYMMETRY-BASEL, 2021, 13 (12):
- [50] THIN-FILM CONDUCTING AND SEMICONDUCTING RESISTANCE THERMOMETERS FOR SURFACE-TEMPERATURE MEASUREMENT [J]. MECHANICAL ENGINEERING, 1977, 99 (06): : 104 - 104