Remote Complex Resistance Measurement

被引：0
|
作者：
V. Aristov
机构：
[1] Institute of Electronics and Computer Science (EDI),
来源：
Automatic Control and Computer Sciences | 2023年 / 57卷
关键词：
remote measurement; human skin resistance; long line;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：469 / 472
页数：3
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