LAYERED SYNTHETIC MICROSTRUCTURES FOR LONG WAVELENGTH X-RAY SPECTROMETRY

被引：19
|
作者：
NICOLOSI, JA [1 ]
GROVEN, JP [1 ]
MERLO, D [1 ]
JENKINS, R [1 ]
机构：
[1] JCPDS INT CTR DIFFRACT DATA, SWARTHMORE, PA 19081 USA
来源：
OPTICAL ENGINEERING | 1986年 / 25卷 / 08期
关键词：
D O I：
10.1117/12.949690
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：964 / 969
页数：6
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