X-RAY-CHARACTERISTICS AND APPLICATIONS OF LAYERED SYNTHETIC MICROSTRUCTURES

被引：0
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作者：
GILFRICH, JV [1 ]
NAGEL, DJ [1 ]
LOTER, NG [1 ]
BARBEE, TW [1 ]
机构：
[1] STANFORD UNIV, STANFORD, CA 94305 USA
来源：
ADVANCES IN X-RAY ANALYSIS | 1982年 / 25卷
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页码：355 / 364
页数：10
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