LAYERED SYNTHETIC MICROSTRUCTURES - MEASUREMENTS AND APPLICATIONS

被引：18
|
作者：
DAY, R [1 ]
GROSSO, J [1 ]
BARTLETT, R [1 ]
BARBEE, T [1 ]
机构：
[1] STANFORD UNIV,STANFORD,CA 94305
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 208卷 / 1-3期
关键词：
D O I：
10.1016/0167-5087(83)91131-6
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：245 / 249
页数：5
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