APPLICATION OF LAYERED SYNTHETIC MICROSTRUCTURES TO HIGH-TEMPERATURE PLASMA DIAGNOSTICS

被引：5
|
作者：
DAY, RH [1 ]
BARBEE, TW [1 ]
机构：
[1] STANFORD UNIV,DEPT MAT SCI & ENGN,STANFORD,CA 94305
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1985年 / 56卷 / 05期
关键词：
D O I：
10.1063/1.1138175
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：791 / 795
页数：5
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