共 50 条
- [1] CHARACTERIZATION TESTS ON LAYERED SYNTHETIC MICROSTRUCTURES AS X-RAY OPTICAL-ELEMENTS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1990, 291 (1-2): : 265 - 271
- [2] Layered synthetic microstructures: Importance of a combined X-ray standing wave and X-ray reflectivity analysis [J]. PHYSICS AT SURFACES AND INTERFACES, 2003, : 109 - 120
- [5] X-RAY AND EXTREME ULTRAVIOLET IMAGING USING LAYERED SYNTHETIC MICROSTRUCTURES [J]. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 316 : 79 - 89
- [6] BRAGG REFLECTIVITY OF LAYERED SYNTHETIC MICROSTRUCTURES IN THE X-RAY ANOMALOUS SCATTERING REGIONS [J]. APPLIED OPTICS, 1983, 22 (01): : 17 - 19
- [7] THE X-RAY QUANTITATIVE-ANALYSIS OF LIGHT-ELEMENTS BY ENERGY-DISPERSIVE X-RAY SPECTROMETRY [J]. JOURNAL OF ELECTRON MICROSCOPY, 1982, 31 (03): : 337 - 337
- [8] X-ray analysis of light elements by monochromatic light [J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 1998, 22 (04): : 378 - 382
- [10] Light elements quantitative determination with x-ray mini diffractometer [J]. LASERS FOR MEASUREMENTS AND INFORMATION TRANSFER 2002, 2003, 5066 : 337 - 342