HOT-ELECTRON TEMPERATURE IN INAS MEASURED BY TUNNELING

被引:33
|
作者
ROWELL, JM [1 ]
TSUI, DC [1 ]
机构
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
来源
PHYSICAL REVIEW B | 1976年 / 14卷 / 06期
关键词
D O I
10.1103/PhysRevB.14.2456
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:2456 / 2463
页数:8
相关论文
共 50 条
  • [41] PUMP WAVELENGTH DEPENDENCE OF HOT-ELECTRON TEMPERATURE IN GAAS
    SHAH, J
    LIN, C
    LEHENY, RF
    DIGIOVANNI, AE
    SOLID STATE COMMUNICATIONS, 1976, 18 (04) : 487 - 489
  • [42] ROOM-TEMPERATURE OPERATION OF HOT-ELECTRON TRANSISTORS
    LEVI, AFJ
    CHIU, TH
    APPLIED PHYSICS LETTERS, 1987, 51 (13) : 984 - 986
  • [43] SIMPLE METHOD FOR MEASURING HOT-ELECTRON TEMPERATURE IN GAAS
    JIANG, XS
    YU, LS
    WANG, SM
    LIU, HX
    ELECTRONICS LETTERS, 1987, 23 (01) : 55 - 56
  • [44] ROOM-TEMPERATURE BEHAVIOR IN HIGH BARRIER HETEROSTRUCTURE HOT-ELECTRON DIODES AND RELATED RESONANT TUNNELING EFFECTS
    HIGMAN, TK
    FAVARO, ME
    MILLER, LM
    COLEMAN, JJ
    INSTITUTE OF PHYSICS CONFERENCE SERIES <D>, 1989, (96): : 321 - 324
  • [45] ROOM-TEMPERATURE OPERATION OF A RESONANT-TUNNELING HOT-ELECTRON TRANSISTOR BASED INTEGRATED-CIRCUIT
    MOISE, TS
    SEABAUGH, AC
    BEAM, EA
    RANDALL, JN
    IEEE ELECTRON DEVICE LETTERS, 1993, 14 (09) : 441 - 443
  • [46] HOT-ELECTRON PERCOLATION
    RIDLEY, BK
    SOLID-STATE ELECTRONICS, 1990, 33 (07) : 859 - 861
  • [47] ELECTRON-TEMPERATURE FLUCTUATION NOISE IN HOT-ELECTRON SUPERCONDUCTING MIXERS
    EKSTROM, H
    KARASIK, B
    APPLIED PHYSICS LETTERS, 1995, 66 (23) : 3212 - 3214
  • [48] HOT-ELECTRON SPECTROSCOPY
    HAYES, JR
    PHYSICA SCRIPTA, 1987, T19A : 171 - 178
  • [49] ROOM-TEMPERATURE BEHAVIOR IN HIGH BARRIER HETEROSTRUCTURE HOT-ELECTRON DIODES AND RELATED RESONANT TUNNELING EFFECTS
    HIGMAN, TK
    FAVARO, ME
    MILLER, LM
    COLEMAN, JJ
    GALLIUM ARSENIDE AND RELATED COMPOUNDS 1988, 1989, : 321 - 324
  • [50] HOT-ELECTRON SPECTROSCOPY
    HAYES, JR
    LEVI, AFJ
    WIEGMANN, W
    ELECTRONICS LETTERS, 1984, 20 (21) : 851 - 852