HOT-ELECTRON SPECTROSCOPY

被引：40
|
作者：
HAYES, JR [1 ]
LEVI, AFJ [1 ]
WIEGMANN, W [1 ]
机构：
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
来源：
ELECTRONICS LETTERS | 1984年 / 20卷 / 21期
关键词：
D O I：
10.1049/el:19840578
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：851 / 852
页数：2
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