LIVE X-RAY TOPOGRAPHY AND ITS APPLICATION TO THE STUDY OF DISLOCATIONS IN SILICON-CRYSTALS

被引：0
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作者：
CHIKAWA, J
机构：
来源：
JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS | 1983年 / 8卷
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中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
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页码：13 / 22
页数：10
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