LIVE X-RAY TOPOGRAPHY AND ITS APPLICATION TO THE STUDY OF DISLOCATIONS IN SILICON-CRYSTALS

被引：0
|
作者：
CHIKAWA, J
机构：
来源：
JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS | 1983年 / 8卷
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：13 / 22
页数：10
相关论文
共 50 条
  • [21] Dislocations of ZnO single crystals examined by X-ray topography and photoluminescence
    Yoshino, K.
    Yoneta, M.
    Yonenaga, I.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2008, 19 (02) : 199 - 201
  • [22] MEASUREMENT OF SHIFT RATES OF DISLOCATIONS IN SILICON USING X-RAY TOPOGRAPHY
    GEORGE, A
    ESCARAVA.C
    SCHROTER, W
    CHAMPIER, G
    ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S161 - S161
  • [23] COMPUTER-SIMULATION OF X-RAY TOPOGRAPHS OF CURVED SILICON-CRYSTALS
    GREEN, GS
    TANNER, BK
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1987, (87): : 627 - 632
  • [24] X-RAY TOPOGRAPHIC OBSERVATION OF MOVING DISLOCATIONS IN SILICON CRYSTALS
    CHIKAWA, J
    ABE, T
    FUJIMOTO, I
    APPLIED PHYSICS LETTERS, 1972, 21 (06) : 295 - &
  • [25] X-Ray Topography Study of Microsegregation in Crystals
    Prokhorov, I. A.
    Bezbakh, I. Z.
    Zakharov, B. G.
    Shul'pina, I. L.
    JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES, 2007, 1 (03) : 260 - 264
  • [26] X-ray topography study of microsegregation in crystals
    I. A. Prokhorov
    I. Z. Bezbakh
    B. G. Zakharov
    I. L. Shul’pina
    Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2007, 1 : 260 - 264
  • [27] X-RAY TOPOGRAPHY STUDY OF MICRODEFECTS IN SILICON
    KRYLOVA, NO
    MELING, V
    SHULPINA, IL
    SHEIKHET, EG
    FIZIKA TVERDOGO TELA, 1986, 28 (02): : 440 - 446
  • [28] X-RAY-RADIATION POLARIZATION IN THE CURVE REGION FOR A BRAGG REFLECTION OF SILICON-CRYSTALS WITH DISLOCATIONS
    OLEKHNOVICH, NM
    MARKOVICH, VL
    OLEKHNOVICH, AI
    KRISTALLOGRAFIYA, 1982, 27 (05): : 886 - 890
  • [29] INSITU X-RAY-OBSERVATION OF DISLOCATIONS IN SILICON-CRYSTALS NEAR THE MELTING-POINT
    CHIKAWA, J
    JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS, 1984, 13 : 55 - 73
  • [30] Using of acoustic waves in X-ray topography of silicon crystals
    Novikov, SN
    Fedortsov, DG
    Dovganyuk, VV
    SIXTH INTERNATIONAL CONFERENCE ON CORRELATION OPTICS, 2003, 5477 : 222 - 228
12345