LIVE X-RAY TOPOGRAPHY AND ITS APPLICATION TO THE STUDY OF DISLOCATIONS IN SILICON-CRYSTALS

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作者：

CHIKAWA, J

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来源：

JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS | 1983年 / 8卷

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TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

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页码：13 / 22

页数：10

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