PECULIARITIES OF X-RAY LAUE DIFFRACTION IN THIN SILICON-CRYSTALS CONTAINING PURE AND DECORATED DISLOCATIONS

被引：0

作者：

DATSENKO, LI

KHRUPA, VI

SKOROKHOD, MY

NIKOLAEV, VV

机构：

来源：

UKRAINSKII FIZICHESKII ZHURNAL | 1987年 / 32卷 / 01期

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D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：97 / 102

页数：6

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[1] INELASTIC X-RAY-SCATTERING IN PERFECT SILICON-CRYSTALS UNDER THE LAUE DIFFRACTION
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[J]. PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1987, 13 (12): : 744 - 749
[2] INTERACTION OF DISLOCATIONS WITH IMPURITIES IN SILICON-CRYSTALS STUDIED BY INSITU X-RAY TOPOGRAPHY
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[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1983, 47 (05): : 753 - 766
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[J]. JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS, 1983, 8 : 13 - 22
[4] X-RAY LAUE DIFFRACTION FROM PROTEIN CRYSTALS
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[J]. SCIENCE, 1984, 223 (4643) : 1423 - 1425
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PETSKO, GA
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[J]. PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1988, 85 (01) : 112 - 115
[7] X-RAY-SCATTERING BY THIN REAL SILICON-CRYSTALS
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[J]. FIZIKA TVERDOGO TELA, 1982, 24 (03): : 950 - 952
[8] X-RAY DIFFRACTION TOPOGRAPHIC STUDY OF SILICON CRYSTALS NEARLY FREE FROM DISLOCATIONS
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[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : S43 - &
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[10] X-RAY BRAGG REFLECTION AND STRAIN COMPENSATION IN SILICON-CRYSTALS
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[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1980, 13 (FEB) : 31 - 33

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