The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy

被引：126

作者：

Lee, N. J. ^{[1
]}

Yoo, J. W. ^{[1
]}

Choi, Y. J. ^{[1
,2
]}

Kang, C. J. ^{[1
,2
]}

Jeon, D. Y. ^{[3
]}

Kim, D. C. ^{[3
]}

Seo, S. ^{[3
]}

Chung, H. J. ^{[3
]}

机构：

[1] Myongji Univ, Dept Nano Sci & Engn, Yongin 449728, Gyeonggi Do, South Korea

[2] Myongji Univ, Dept Phys, Yongin 449728, Gyeonggi Do, South Korea

[3] Samsung Adv Inst Technol, Yongin 446712, Gyeonggi Do, South Korea

来源：

APPLIED PHYSICS LETTERS | 2009年 / 95卷 / 22期

关键词：

carrier density; graphene; surface potential; work function; CARBON; LAYER;

D O I：

10.1063/1.3269597

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on the interlayer screening effect of graphene using Kelvin probe force microscopy (KPFM). By using a gate device configuration that enables the supply of electronic carriers in graphene sheets, the vertical screening properties were studied from measuring the surface potential gradient. The results show layer-dependence of graphene sheets, as the number of graphene layers increases, the surface potential decreases exponentially. In addition, we calculate the work function-related information of the graphene layers using KPFM.

引用

页数：3

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