The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy

被引：126
|
作者：
Lee, N. J. [1 ]
Yoo, J. W. [1 ]
Choi, Y. J. [1 ,2 ]
Kang, C. J. [1 ,2 ]
Jeon, D. Y. [3 ]
Kim, D. C. [3 ]
Seo, S. [3 ]
Chung, H. J. [3 ]
机构：
[1] Myongji Univ, Dept Nano Sci & Engn, Yongin 449728, Gyeonggi Do, South Korea
[2] Myongji Univ, Dept Phys, Yongin 449728, Gyeonggi Do, South Korea
[3] Samsung Adv Inst Technol, Yongin 446712, Gyeonggi Do, South Korea
来源：
APPLIED PHYSICS LETTERS | 2009年 / 95卷 / 22期
关键词：
carrier density; graphene; surface potential; work function; CARBON; LAYER;
D O I：
10.1063/1.3269597
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report on the interlayer screening effect of graphene using Kelvin probe force microscopy (KPFM). By using a gate device configuration that enables the supply of electronic carriers in graphene sheets, the vertical screening properties were studied from measuring the surface potential gradient. The results show layer-dependence of graphene sheets, as the number of graphene layers increases, the surface potential decreases exponentially. In addition, we calculate the work function-related information of the graphene layers using KPFM.
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页数：3
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