3D SoC integration, beyond 2.5D chiplets

被引:22
|
作者
Beyne, Eric [1 ]
Milojevic, Dragomir [1 ]
Van der Plas, Geert [1 ]
Beyer, Gerald [1 ]
机构
[1] IMEC, Leuven, Belgium
关键词
TECHNOLOGY;
D O I
10.1109/IEDM19574.2021.9720614
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
2.5D "Chiplet" approaches allow for a dense integration of independently designed & fabricated ICs. However, this inherently adds a significant interconnect latency, therefore limiting the application to latency-tolerant applications. This added latency can be eliminated by introducing a "3D-SoC" design approach This is an extension of the highly successful 2D System-on-Chip (SoC) design methodology, where the system is automatically partitioned into separate chips that are concurrently designed & interconnected in the 3rd dimension. To realize such 3D-SoC circuits, the 3D interconnect pitch needs to be scaled further beyond the current state-of-the-art. Our current research has demonstrated the feasibility of realizing such interconnections at 7 mu m pitch for die-to-die stacking and 700nm pitch for wafer-to-wafer (W2W).
引用
收藏
页数:4
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