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- [23] Statistical analysis of pull-chip leakage power for 65nm CMOS node and beyond Chin J Electron, 2009, 1 (20-24):
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- [28] Process and materials considerations for Pb-free flip chip packaging of 65nm Cu/low-k device EPTC 2006: 8TH ELECTRONIC PACKAGING TECHNOLOGY CONFERENCE, VOLS 1 AND 2, 2006, : 336 - 339
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