Dynamic test set generation for analog circuits and systems

被引：1

作者：

Huynh, S ^{[1
]}

Kim, SW ^{[1
]}

Soma, M ^{[1
]}

Zhang, JY ^{[1
]}

机构：

[1] Univ Washington, Dept Elect Engn, Seattle, WA 98195 USA

来源：

SEVENTH ASIAN TEST SYMPOSIUM (ATS'98), PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/ATS.1998.741639

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we present an approach to construct a set of dynamic rest signals for analog circuits and systems. Testability transfer factors are introduced and we use them as the basis to construct an efficient test set. Fault detectability mid fault coverage are defined Two circuits from the suite of analog and mixed-signal circuits [3] are used to evaluate our approach. The fault coverage is 100% for both circuits studied. The approach presented may be used to construct inputs signals for rile selection of an external stimulus applied through an arbitrary waveform generator.

引用

页码：360 / 365

页数：6

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