Mixed-signal LSI relationship among measurement accuracy, yield, and test time

被引：0
|
作者：
Kohinata, H
Arai, M
Fukumoto, S
Iwasaki, K
机构：
来源：
DBT 2004: PROCEEDINGS OF THE 2004 IEEE INTERNATIONAL WORKSHOP ON CURRENT & DEFECT BASED TESTING | 2004年
关键词：
D O I：
10.1109/DBT.2004.1408952
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
As the degree of LSI integration is becoming rapidly greater and circuit size is becoming bigger, the bigger LSI test cost due to longer test time in LSI production becomes more serious. This paper will discuss how much impact mixed LSI measurement accuracy improvement affects test time and LSI yield by analyzing the test results in a production test. It will be a practical and effective example for the semiconductor industry to show the relationship among measurement accuracy, test time, and yield based on the actual test data.
引用
收藏
页码：43 / 45
页数：3
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