Mixed-signal test training at CRTC.

被引:0
|
作者
Bertrand, Y [1 ]
Azaïs, F [1 ]
Flottes, ML [1 ]
Lorival, R [1 ]
机构
[1] Univ Montpellier 2, UMR CNRS 55060, LIRMM, F-34392 Montpellier 5, France
来源
关键词
D O I
暂无
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
引用
收藏
页码:251 / 254
页数:4
相关论文
共 50 条
  • [1] Mixed-signal test
    Majhi, AK
    Agrawal, VD
    [J]. ELEVENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 1997, : 285 - 288
  • [2] Mixed-signal functional test
    Bullis, David C.
    [J]. Evaluation Engineering, 1988, 27 (12):
  • [3] Test throughput for mixed-signal devices
    Kramer, R
    [J]. IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, 2005, 8 (01) : 12 - 15
  • [4] An analog mixed-signal test controller
    AbedEl-Halin, MA
    [J]. 2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, CONFERENCE PROCEEDINGS, 2002, : 384 - 387
  • [5] Mixed-signal simulation & test generation
    Dufils, Martine
    Carbonero, Jean-Louis
    Planelle, Philippe
    Raynaud, Philippe
    [J]. IEEE DTIS: 2006 INTERNATIONAL CONFERENCE ON DESIGN & TEST OF INTEGRATED SYSTEMS IN NANOSCALE TECHNOLOGY, PROCEEDINGS, 2006, : 228 - 233
  • [6] TEST ISSUES IN MIXED-SIGNAL ASICS
    HENDERSON, DF
    [J]. COMPUTER DESIGN, 1991, 30 (11): : 103 - 103
  • [7] Mixed-signal simulation and test generation
    Dufils, M.
    Carbonero, J. L.
    Planelle, P.
    Raynaud, P.
    [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 2008, 95 (03) : 239 - 248
  • [8] Workshop concentrates on mixed-signal test
    [J]. Electronic Design, 1995, 43 (08):
  • [9] Convergent SOCs challenge mixed-signal test
    Vana, T
    Blair, D
    [J]. EE-EVALUATION ENGINEERING, 2003, 42 (01): : 24 - +
  • [10] Getting to a test standard for mixed-signal boards
    Osseiran, A
    [J]. 38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2, 1996, : 1157 - 1161